Advanced X-ray Scattering
Our work is focused on advanced x-ray scattering methods for surface analysis, optical analytics as well as artificial neural networks that facilitate analysis and interpretation of the large amounts of data generated by these methods.
Short CV:
After studying physics at the Ludwig Maximilian University in Munich, Stefan Kowarik completed a doctorate in physical chemistry at Oxford University in 2006. Postdoctoral stints took him to Tübingen and Cornell Universities, and an Alexander von Humboldt scholarship to the University of California, Berkeley. In 2009, he was appointed Junior Professor of Physics at Berlin’s Humboldt University. Stefan Kowarik worked at the Federal Institute for Materials Research and Testing from 2017 until joining the University of Graz in 2020.